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Whether you need a cost-effective manual station for probing 150mm wafers or a semiautomatic thermal station to probe 200mm or 300mm wafers, FormFactor offers a complete line of high-performance solutions for on-wafer probing, circuit boards and modules, vertical probe cards, MEMS, electro-optic devices and more. Probe stations are available with accessories such as thermal control systems, special cables, calibration software, and industry-leading probes that help you position, calibrate, and characterize your device under test. FormFactor pioneered the first 1 femtoamp measurement, and offers systems that probe up to 220 GHz with extremely low leakage and low contact resistance.

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cascade 02 newPROBE CARD

Pyramid Probe cards are rugged, robust, and well suited for the rigors of high-performance production wafer sort. Its industry-leading signal integrity and mechanical alignment capabilities make these probe cards the perfect fit for multi-die testing for RF wireless, high-speed digital in SiPs, SoCs, and leading edge DC parametric testing.

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cascade 03PROBES

FormFactor offers more than 50 different analytical probe models for wafer, package, and board level characterization. We offer RF, microwave and millimeter-wave probes in the Infinity Probe®, T-Wave Probe™, Air Coplanar Probe and |Z| Probe® families, as well as probes for DC parametric test and failure analysis

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